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IEET-2015

Forming the Panoramic SPM-Images Scans during Nanoparticles Dispersity

Gulyaev, P.V., Shelkovnikov, E.Yu., Tyurikov, A.V., Korshunov, A.I.

Abstract. The basic principles of particles detectors application, overlapped SPM-images binding programs, positioning devices and sensors for nanoparticles in the scanning probe microscopy research are described.

Keywords: scanning tunneling microscopy, coordinate binding, characteristic point of the image, basis function, image shift and angle of rotation


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< IEET-2015

< IEET-2015

Timeline

November 3, 2017

Registration deadline

November 17, 2017

Conference program

November 22, 2017

Plenary session

November 23–24, 2017

Work of sessions

 
 

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