IEET-2016

Technique of Cluster Analysis Application in Semiconductor Elements Classification for Improving Product Quality and Reliability

Mishanov, R. O.

Abstract.The text deals with the information about application of cluster analysis for the purpose of semiconductor elements classification. The technique of semiconductor elements classification on groups based on application of k-means clustering is offered. Using the offered technique the research of CMOS chips selection was conducted. A time delay on the leading edge of the signal and a critical voltage supply were used as informative parameters of the chips. The recommendations about application of this technique in case of large number of informative parameters are offered.

Keywords:cluster analysis, k-means clustering, cluster group, informative parameter, Euclidean distance, dendrogram